05.01.03
Foss has introduced a new line of process analyzers featuring XDS near-infrared (NIR) technology for improved analytical performance, instrument matching and simplified method development. XDS Process Analytics™ combines both NIST traceable standards and methods with the latest NIR technical advancements, such as photometric, band pass and wavelength response matching. XDS Process Analytics are available in both single and multiple point versions that can be configured to analyze clear to opaque liquids, slurries, suspensions and solids.